Scanning Electron Microscope (SEM) – JSM-IT210

The JSM-210 is the most compact stationary scanning electron microscope of JEOL.
A motor-driven for all five axes of movement, making it safer and faster to use.
In addition, the newly equipped "Simple SEM" automatically acquires observation and analysis by simply selecting the field of view.

יצרן: JEOL

קטגוריה: Electron Microscopy Tags: JEOL Israel, Scanning Electron Microscope, SEM מותג: JEOL

תיאור

Scanning Electron Microscope (SEM) – JSM-IT210 features:

Guide from specimen exchange to automatic observation "Specimen Exchange Navi
Magnify the optical image, transition to SEM image "Zeromag"
Embedded EDS for Real-Time elemental composition during observation "Live Analysis"
Automation for enhanced productivity "Simple SEM"
Standard 60 mm² large diameter EDS for fast analysis