Transmission Electron Microscope : (TEM) JEM-F200 Multi-purpose

JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally friendly, energy saving system.

יצרן: JEOL



Quad-Lens condenser system

Today's electron microscopy requires to support a wide range of imaging techniques from bright field/dark field TEM to STEM that uses a variety of detectors.
The JEM-F200, with its new 4-stage probe-forming optical system, that is, Quad-Lens Condenser System, controls intensity and the convergence angle of electron beam independently, to respond to the different research requirements.

Advanced Scan system

The JEM-F200 incorporates a new scanning system, Advanced Scan System, which is capable of scanning the electron beam in the image probe forming systems. This accomplishes wide field STEM-EELS.

Pico Stage Drive

The JEM-F200 uses a pico stage drive, which is capable of driving the stage in 200 pico meter step without a piezo drive, and moving the view area with a wide dynamic range from an entire sample grid to atomic order images.

SPECPORTER (auto holder loading/unloading device)

Loading/unloading of a specimen holder has been considered to bring a human error of operation, especially for the beginners.
The JEM-F200 incorporates a new device, SPECPORTER, to facilitate loading and unloading of the specimen holder.
Placing a specimen holder at a given location, and activating the SPECPORTER by a single click insures safe loading and unloading of the holder.

Improved cold FEG

The JEM-F200 supports an optional cold field emission electron gun.
Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, and accelerates the analytical process owe to the high brightness electron beam, and by minimizes chromatic aberrations originated from the electron source energy spread enables higher resolution imaging.

Dual SDD

The JEM-F200 simultaneously supports two units of an optional high sensitivity large silicon drift detectors (SDD).
The SDD, featuring enhanced sensitivity, enables speedy EDS analysis while minimizing sample damage.

צרו קשר

היי! שמחים שהגעתם לאתר שלנו! באתר יש כרגע מאות מוצרים ואנחנו מוסיפים מוצרים כל הזמן. אם לא מצאתם את מה שחיפשתם או שאין לכם כוח לחפש (קורה לכולנו), כתבו לנו כאן מה המוצר שאתם מחפשים ונשלח אליכם הצעת מחיר/נחזור אליכם

    דילוג לתוכן